翻訳と辞書 Words near each other ・ Device Forts ・ Device independence ・ Device independent file format ・ Device independent pixel ・ Device Keys ・ Device Management Forum ・ Device Manager ・ Device mapper ・ Device Master Record ・ Device paradigm ・ Device register ・ Device Remover ・ Device Software Optimization ・ Device tracking software ・ Device tree ・ Device under test ・ Device – Voice – Drum ・ Device-independent quantum cryptography ・ Device-to-device ・ DeviceLogics ・ DeviceNet ・ Devices and Desires ・ Devices Profile for Web Services ・ Devicescape ・ Devich ・ Devichour ・ Devichye Pole ・ Devick Lake (British Columbia) ・ Devico AS ・ DeVicq Glacier Dictionary Lists mini英和辞書 mini和英辞書 Webster 1913 Latin-English FOLDOC Wikipedia English ウィキペディア

翻訳と辞書　辞書検索 [ 開発暫定版 ] スポンサード リンク Device under test ： ウィキペディア英語版 Device under test Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term commonly used to refer to a manufactured product undergoing testing. ==Electronics testing== The term DUT is used within the electronics industry to refer to any electronic assembly under test. For example, cell phones coming off of an assembly line may be given a final test in the same way as the individual chips were earlier tested. Each cell phone under test is, briefly, the DUT. The DUT is often connected to the test equipment using a bed of nails tester of pogo pins. 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「Device under test」の詳細全文を読む スポンサード リンク 翻訳と辞書 : 翻訳のためのインターネットリソース Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.